JPS5839905A - 球面レンズと半導体レ−ザの軸合わせ方法及び装置 - Google Patents

球面レンズと半導体レ−ザの軸合わせ方法及び装置

Info

Publication number
JPS5839905A
JPS5839905A JP13879181A JP13879181A JPS5839905A JP S5839905 A JPS5839905 A JP S5839905A JP 13879181 A JP13879181 A JP 13879181A JP 13879181 A JP13879181 A JP 13879181A JP S5839905 A JPS5839905 A JP S5839905A
Authority
JP
Japan
Prior art keywords
semiconductor laser
spherical lens
optical axis
output
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13879181A
Other languages
English (en)
Japanese (ja)
Other versions
JPH033176B2 (en]
Inventor
Rumiko Suganuma
菅沼 ルミ子
Yoshio Miyake
三宅 良雄
Masamitsu Saito
斉藤 正光
Akihiro Adachi
明宏 足立
Toshio Takei
竹居 敏夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP13879181A priority Critical patent/JPS5839905A/ja
Publication of JPS5839905A publication Critical patent/JPS5839905A/ja
Publication of JPH033176B2 publication Critical patent/JPH033176B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24Coupling light guides
    • G02B6/42Coupling light guides with opto-electronic elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24Coupling light guides
    • G02B6/42Coupling light guides with opto-electronic elements
    • G02B6/4201Packages, e.g. shape, construction, internal or external details
    • G02B6/4219Mechanical fixtures for holding or positioning the elements relative to each other in the couplings; Alignment methods for the elements, e.g. measuring or observing methods especially used therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Optical Couplings Of Light Guides (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
JP13879181A 1981-09-03 1981-09-03 球面レンズと半導体レ−ザの軸合わせ方法及び装置 Granted JPS5839905A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13879181A JPS5839905A (ja) 1981-09-03 1981-09-03 球面レンズと半導体レ−ザの軸合わせ方法及び装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13879181A JPS5839905A (ja) 1981-09-03 1981-09-03 球面レンズと半導体レ−ザの軸合わせ方法及び装置

Publications (2)

Publication Number Publication Date
JPS5839905A true JPS5839905A (ja) 1983-03-08
JPH033176B2 JPH033176B2 (en]) 1991-01-17

Family

ID=15230294

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13879181A Granted JPS5839905A (ja) 1981-09-03 1981-09-03 球面レンズと半導体レ−ザの軸合わせ方法及び装置

Country Status (1)

Country Link
JP (1) JPS5839905A (en])

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5897008A (ja) * 1981-12-04 1983-06-09 Hitachi Ltd 半導体レ−ザとコリメ−タレンズの位置決め方法
JPH01280729A (ja) * 1988-05-06 1989-11-10 Matsushita Electric Ind Co Ltd 光波長変換装置
CN103727902A (zh) * 2014-01-15 2014-04-16 西安电子科技大学 多段圆柱舱段激光检测对准装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5897008A (ja) * 1981-12-04 1983-06-09 Hitachi Ltd 半導体レ−ザとコリメ−タレンズの位置決め方法
JPH01280729A (ja) * 1988-05-06 1989-11-10 Matsushita Electric Ind Co Ltd 光波長変換装置
CN103727902A (zh) * 2014-01-15 2014-04-16 西安电子科技大学 多段圆柱舱段激光检测对准装置

Also Published As

Publication number Publication date
JPH033176B2 (en]) 1991-01-17

Similar Documents

Publication Publication Date Title
US4732485A (en) Optical surface profile measuring device
CN112513562A (zh) 确定激光加工头与工件距离的测量设备、激光加工系统和确定激光加工头与工件距离的方法
US7099001B2 (en) Auto-collimator
US20160102968A1 (en) Apparatus and method for curvature and thin film stress measurement
CA1159644A (en) Optical triangulation apparatus and method
JPS5839905A (ja) 球面レンズと半導体レ−ザの軸合わせ方法及び装置
US4621924A (en) Optical alignment apparatus
US6624403B2 (en) Autofocus system
US5699158A (en) Apparatus for accurately detecting rectilinear motion of a moving object using a divided beam of laser light
CN116840974B (zh) 一种激光器和硅光芯片双透镜耦合封装方法
JPS5658139A (en) Condensing state monitoring device for optical recorder
JP2504747B2 (ja) 半導体素子と光伝送路との光軸合せ方法およびその装置
JP2000147311A (ja) 光導波路結合装置における位置合わせ方法及びそれを用いて実現される光導波路結合装置
JPS63149513A (ja) 光学式変位計測方法
JP3418234B2 (ja) 測長装置
KR100394314B1 (ko) 광학픽업의광학조정방법
JP2573673B2 (ja) 三角測量方式の光学式変位測定装置
JPH0219810A (ja) 光回路部品の組立装置
JPS61223604A (ja) ギヤツプ測定装置
SU1472760A1 (ru) Устройство дл бесконтактного измерени размеров деталей
JPH074909A (ja) レーザセンサ装置
JPS63172905A (ja) 回折光の分離方法および分離装置
KR100352939B1 (ko) 자동 거리 유지장치를 이용한 물질 표면구조 측정장치
SU1138642A1 (ru) Интерференционное устройство дл дистанционного измерени малых перемещений
JPS62169414A (ja) 露光装置